Beijing Science Instrument Equipment Lecture

In order to improve the instrument operation level and electron microscope analysis level of the electron microscope experimentation personnel of the Capital Science and Technology Condition Platform, and to utilize the role of capital science and technology platform talent resources in serving the society, on November 23rd, the Beijing Scientific Instrument Equipment Collaboration Service Center and the Beijing Electrochemical Analysis Test Society Electron Microscope Branch The "2010 Scanning Electron Microscopy Latest Technology and Experimental Technology Seminar" was jointly held. More than 120 experts and scholars from well-known domestic electron microscope laboratories and electron microscope manufacturers attended the conference.

The meeting invited experts from Peking University, Hitachi, and Tsinghua University to report on related topics of scanning electron microscopy, including some issues in the correct use of scanning electron microscopes, experience in experimental operations, and latest developments in main accessories of scanning electron microscopes. problem. Participants actively asked questions and freely communicated. The atmosphere was lively.

In his concluding remarks, Director Zhang Xiaoqiang of the Beijing Scientific Instrument and Equipment Collaboration Service Center stated that the meeting has facilitated effective communication and exchange between domestic electron microscopy laboratories and manufacturers of electron microscopes. He hoped that participants could exchange and participate in related technical training. At the same time, the establishment of the capital science and technology conditional platform is of great significance for cultivating scientific and technological talents and upgrading the technological capabilities of scientific and technological personnel. It is hoped that through this platform, talent resources and technical resources can be opened and shared.